JY Ultima2 ICP-OES光谱仪测定Ta-2.5W和Ta-10W中钨元素的分析方法研究

详细信息

Study on the Analysis Method of Tungsten Element in Ta-2.5W and Ta-10W by JY Ultima2 CP-OES Spectrometer

1. Ningxia Orient Tantalum Industry Co., Ltd, Shizuishan 753000, China;
2. Northwest Institute of Rare Metal Materials Ningxia Co., Ltd, Shizuishan 753000, China;
3. National Engineering Research Center of Tantalum and Niobium Special Materials, Shizuishan 753000, China

摘要: 采用发射光谱仪建立发射光谱法测定Ta-2.5W和Ta-10W中钨含量的方法。使用高纯氢氧化钽基体的纯钨标准溶液制作工作曲线, 钨的分析线为209.475 nm, 方法的线性范围为1.25%~15.00%, 加标回收率在93.0%~99.0%之间, 测定结果的RSD值 (n=11) 小于0.8%。
- 发射光谱法 /
- 钨 /
- 钽钨合金
Abstract: A method for the determination of tungsten contents in Ta-2.5 W and Ta-10 W was established by using the emission spectrometer. The work curve was made by pure tungsten standard solution of high purity tantalum hydroxide matrix, the analytical line of tungsten was 209.475 nm, the linear range of the method was 1.25%~15.00%, the recovery rate was 93.0%~99.0%, and the relative standard deviation (n=11) of the measured values was less than 0.8%.
- emission spectroscopy /
- tungsten /
- tantalum tungsten alloy