Wei Qin, Zhang Yingyuan, Le Yongkang, You Jianfei. Application of Ultrasonic C-scanning System in Al/SiCp Composite Nondestructive Inspection[J]. Development and Application of Materials, 2003, 18(4): 38-41. DOI: 10.19515/j.cnki.1003-1545.2003.04.012
Citation: Wei Qin, Zhang Yingyuan, Le Yongkang, You Jianfei. Application of Ultrasonic C-scanning System in Al/SiCp Composite Nondestructive Inspection[J]. Development and Application of Materials, 2003, 18(4): 38-41. DOI: 10.19515/j.cnki.1003-1545.2003.04.012
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Application of Ultrasonic C-scanning System in Al/SiCp Composite Nondestructive Inspection

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  • The ultrasonic C scanning system was adopted in SiCp/Al composite nondestructive inspection. By using this method, the sectional profile of the defects inside of the composite could be presented visually and the size and configuration could be judged so that the nature of the defects could be determined with reference to their distribution.
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