FENG Li-ping, XU Xin. Technics of SiO2 Thin Films Prepared on Sapphire[J]. Development and Application of Materials, 2005, 20(3): 32-35. DOI: 10.19515/j.cnki.1003-1545.2005.03.010
Citation: FENG Li-ping, XU Xin. Technics of SiO2 Thin Films Prepared on Sapphire[J]. Development and Application of Materials, 2005, 20(3): 32-35. DOI: 10.19515/j.cnki.1003-1545.2005.03.010

Technics of SiO2 Thin Films Prepared on Sapphire

  • SiO2thin film was successfully prepared on sapphire substrate by RF magnetron reactive sputtering method with silicon as the target and oxygen as the reactive gas.The influences of parameters such as oxygen content RF power and the sputtering pressure on the film deposition rate were analyzed experimentally.The composition of the film was studied and infrared optical property of the film was tested.The results showed that the electron binding energy of silicon and oxygen elements was same as those of in compound SiO2.SiO2films can be obtained on sapphire by RF magnetron reactive sputtering method.The deposited SiO2film has a highly antireflective effect on sapphire substrate.
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