Volume 24 Issue 3
Jun.  2009
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LU Sheng-hui, XIANG Lan-xiang, ZHOU Xin-yan, CHEN Zong-zhang, LI Su-fang, SHA Shun-ping. Effects of Electron Mobility on Yttria-stabilized Zirconia[J]. Development and Application of Materials, 2009, 24(3): 23-26. DOI: 10.19515/j.cnki.1003-1545.2009.03.007
Citation: LU Sheng-hui, XIANG Lan-xiang, ZHOU Xin-yan, CHEN Zong-zhang, LI Su-fang, SHA Shun-ping. Effects of Electron Mobility on Yttria-stabilized Zirconia[J]. Development and Application of Materials, 2009, 24(3): 23-26. DOI: 10.19515/j.cnki.1003-1545.2009.03.007

Effects of Electron Mobility on Yttria-stabilized Zirconia

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  • Received Date: December 17, 2008
  • Available Online: March 29, 2024
  • The electron mobility was measured to investigate the influence of test temperature, densification, oxygen concentration and doped alumina on performance of yttria-stabilized zirconia (YSZ) .The result shows that the lower oxygen concentration in testing electrode, the more influence of electron mobility on potential of YSZ cell and the amount of electron mobility is larger at lower work temperature to oxygen sensor.The high sintering density of YSZ and proper addition of alumina can decrease the amount of electron mobility and increase the accuracy of oxygen sensor.
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