The Method of Quasi-optical Resonator for the Measurement of Complex Permittivity of Dielectric Materials

A method for the measurement of complex permittivity of dielectric materials at millimeter wave and submillimeter wave bands by means of an electromagnetic open resonator is introduced.Quasi-optical resonators, which have advantages such as high quality factor, easy to run and to place sample, can accomplish electrical dielectric parameter measurement of dielectric material effectively.The resonator is of the hemispherical type and consists of one plane and concave copper mirror.Quasi-optical resonator system and newest research result and improvement method by using fixing resonator length method or fixing frequency method are also covered with the measurement on some multilayered films and measurement method at high frequency as examples.