ZHOU Wen-tao, GU Feng, HE Shu-yu. Cause Analysis and Control Methods for Silicon Rod Crack in Polycrystalline Silicon[J]. Development and Application of Materials, 2015, 30(3): 78-80. DOI: 10.19515/j.cnki.1003-1545.2015.03.015
Citation: ZHOU Wen-tao, GU Feng, HE Shu-yu. Cause Analysis and Control Methods for Silicon Rod Crack in Polycrystalline Silicon[J]. Development and Application of Materials, 2015, 30(3): 78-80. DOI: 10.19515/j.cnki.1003-1545.2015.03.015

Cause Analysis and Control Methods for Silicon Rod Crack in Polycrystalline Silicon

  • The cause analysis for silicon rod crack in polysilicon reduction process was carried out, and the procedures of polysilicon reduction process including silicon core machine, silicon core cleaning, silicon core installation, reduction furnace gas replacement, silicon core deposition processes, and shutdown process.And the control methods of silicon rod crack was proposed.
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