Failure Analysis and Research of Tantalum Powder for Capacitor
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摘要: 利用扫描电镜进行电容器用钽阳极失效原因分析,造成单支阳极块漏电流异常偏大甚至被击穿的主要原因为:局部存在的夹杂物质引起氧化膜生长异常导致颗粒表面局部钽氧化物薄膜不连续,大量的电子通过造成漏流偏大甚至击穿。阳极块中出现的异物为原料钽锭中存在的钽的碳化物夹杂,由于其高熔点、耐酸蚀的特点使得钽粉后续处理过程中无法去除而保留在了钽粉中。背散射电子成像可应用于钽样品检测。Abstract: The reasons for large leakage current or the breaking down of the single tantalum anode block of capacitor are analyzed by using the scanning electron microscopy, and the main reason is that the local inclusions cause the abnormal growth of the oxide film, resulting in the discontinuity of the local tantalum oxide film on the surface of the particles, therefore, a large number of electrons pass through the leakage and even leads to the breakdown of the anode. The foreign body appearing in the tantalum anode block is the carbide inclusion of tantalum in the raw material of tantalum ingot, and the carbide inclusion of tantalum has high melting point and acid erosion resistance. In the subsequent treatment of the tantalum powder, the carbide inclusion of tantalum cannot be removed and remains in the tantalum powder. Backscatter electron imaging can be applied to tantalum sample detection.
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Key words:
- tantalum powder /
- mixed up /
- backscattering /
- tantalum carbide
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